tce
 
Contact TCE
 
Products > Device Characterisation Software > Device Characterisation Software
Device Characterisation Software
Device Characterisation Software

Focus Microwaves characterization software is written in Windows® C/C++. Software Tools are provided for all Load Pull and Noise measurements using automatic tuners, including XY plot and 2D/3D contouring software with a multitude of options.
 
  Please click on the above link for further information