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Products > Cryogenic Probe Stations > Cryogenic Probe Stations
Cryogenic Probe Stations
Cryogenic Probe Stations

Unique Wafer-Level Probing down to 4 K
Features and Benefits:
  • Test your devices at temperatures from 4 to 400 K
  • Probing is as simple as on standard wafer-level probers
  • Easy and ergonomic wafer handling with special substrate carriers
  • Full range of accessories for a complete cryogenic testing solution
  • Manual and semiautomatic versions available
 
  Please click on the above link for further information